Comparative profilometry - Lin Yangchen
©Lin Yangchen


previous section | next section | back to table of contents


Constructing a high-resolution digital elevation model of the surface of striated paper using a Keyence industrial microscope on a separate occasion. The instrument looks more like an electron microscope than a light microscope.

Acknowledgements
I am grateful to David Beech, Julian Tan and Edmond Soh for discussions and technical assistance, and to Keyence Singapore for the use of their equipment.

References


previous section | next section | back to table of contents
Powered by SmugMug Log In